PROJ_DIR := .

include Makefile.config
include Makefile.util
include tools/Makefile.tools

TEST_TARGETS := $(addprefix test_,$(shell ls tests))

TOOLS_TARGETS := $(addprefix tools/,$(TOOLS))

GENERATED_MEM_FILES := $(shell find design/ -name "*.s.tcl")
GENERATED_MEM_FILES := $(basename $(basename $(GENERATED_MEM_FILES)))
GENERATED_MEM_FILES := $(addsuffix .mem,$(GENERATED_MEM_FILES))

all : design.bin


design.v : design/rom.mem design/*.v
	$(IV) -Iinclude/ -E $(filter %.v,$^) \
		-DROM_WORDS_COUNT=$(call FILE_LINES,$<) -o $@

design.json : design.v design/rom.mem design/font.mem
	$(YOSYS) -p 'read_verilog -defer $<' \
	         -p 'synth_ice40 -top $(TOPMODULE) -json $@'

design.asc : design.json $(PCF)
	$(PNR) --hx8k --asc $@ --pcf $(PCF) --json $< --package ct256

design.bin : design.asc
	$(ICEPACK) $< $@

timing.rpt : design.asc
	$(ICETIME) -d hx8k -mtr $@ $<

prog : design.bin
	sudo iceprogduino $<


CALL_TESTS = \
	cd tests/; \
	for TEST in $(1); do \
		echo "** $$TEST "; \
		if ! $(MAKE) -C $$TEST $(2) 3>&1 1>/dev/null 2>&3; then \
			FAIL=true; \
		fi; \
	done; \
	[ "$$FAIL" != true ]

test :
	$(call CALL_TESTS,*)

# Will skip VGA tests, because they take loooong time
quicktest :
	$(call CALL_TESTS,*,QUICK_TEST=1)

stack_machine_test :
	$(call CALL_TESTS,stack_machine_*)

stack_machine_quicktest :
	$(call CALL_TESTS,stack_machine_*,QUICK_TEST=1)

wasm_compile_test :
	$(call CALL_TESTS,wasm_compile_*)

$(TEST_TARGETS) : test_% :
	$(MAKE) -C tests/$*


tools : $(TOOLS_TARGETS)

$(TOOLS_TARGETS) : tools/% :
	$(MAKE) -C tools/ $*


clean :
	for TEST in tests/*; do $(MAKE) -C $$TEST clean >/dev/null; done
	rm $(GENERATED_MEM_FILES) 2>/dev/null || true
	$(MAKE) -C tools/ clean >/dev/null
	rm $(addprefix design.,v json asc bin) timing.rpt 2>/dev/null || true

.PHONY : all tools test quicktest stack_machine_test stack_machine_quicktest \
	wasm_compile_test $(TEST_TARGETS) $(TOOLS_TARGETS) tools